Microchip Adds the LX-820 Quartz Oscillator to its L-Series Timing Portfolio Developed for Low Earth Orbit Applications
Key Highlights
- ➤Microchip launches LX-820 radiation-tolerant oscillator for LEO and space applications
- ➤L-Series oscillators offer radiation tolerance up to 50 krad and SEL testing to 40 MeV·cm²/mg
- ➤L-Series configurations available from stock or with lead times under 20 weeks
- ➤LX-820 supports CMOS frequencies from 1.25 MHz to 135 MHz and LVDS frequencies from 100 MHz to 250 MHz
- ➤LX-820 is available in production quantities in a compact 3.2 mm × 2.5 mm package
Expert Statements
Randy Brudzinski, Corporate vice president of Microchip’s frequency and time systems business unit
“Satellite developers should not have to choose between dependable precision timing and the cost and schedule requirements of their mission.”
Randy Brudzinski, Corporate vice president of Microchip’s frequency and time systems business unit
“Our L-Series oscillators bring together the performance, radiation tolerance and supply availability our customers need to confidently deploy their New Space applications using a precision timing solution that helps reduce both schedule and mission risk.”
CHANDLER, Ariz., Oct. 22, 2026 (GLOBE NEWSWIRE) -- Microchip Technology (Nasdaq: MCHP) today announces the expansion of its L-Series of timing devices with the launch of its LX-820 Radiation-Tolerant Quartz Oscillator, designed for Low Earth Orbit (LEO) and other space applications. The L-Series portfolio provides satellite developers with a wide range of oscillator architectures to select from, each with varying frequency stability, phase noise, power and size, catering to different mission requirements.
The L-Series is positioned between commercial off-the-shelf (COTS) oscillators and traditional high-reliability space products, combining commercial- or military-grade components with production inspection, electrical and thermal analysis and hybrid manufacturing. The L-Series oscillators have passed Total Ionizing Dose (TID) and Single-Event Latchup (SEL) testing as complete, functioning devices, with radiation tolerance up to 50 krad and SEL testing to 40 MeV·cm²/mg. Additionally, most L-Series products also use swept quartz to reduce radiation-induced frequency drift. The L-Series OCXOs incorporate ruggedized construction and four-point crystal mounts designed to survive launch and the intended mission profile.
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