Teradyne Announces Magnum E2 to Address Next-Generation Memory Test Demands Driven by AI and High-Performance Computing
Business Wire•29/09/2026•09:00 ET
0
Key Highlights
- ➤Teradyne (TER) announced Magnum E2, a high-speed memory test system.
- ➤Magnum E2 supports LPDDR6, DDR6, GDDR7, and NAND flash interfaces.
- ➤Near-DUT architecture delivers high-speed signal integrity and high parallelism.
- ➤Magnum E2 supports production and engineering configurations on common hardware and software.
- ➤Platform supports NRZ, PAM3, and PAM4 signaling without requiring tester replacement.
Expert Statements
Ben Han, President of the Memory Test division at Teradyne
“The memory inside an AI accelerator is as critical to system performance as the compute die itself, and the test requirements have never been more demanding.”
Ben Han, President of the Memory Test division at Teradyne
“As the industry moves to advanced DRAM and high-speed NAND flash for enterprise SSDs, our customers cannot afford a test platform that forces a choice between signal integrity and throughput. Magnum E2 was built to eliminate this trade-off and give leading memory manufacturers a platform they can qualify today and grow with for the future.”
Teradyne Announces Magnum E2 to Address Next-Generation Memory Test Demands Driven by AI and High-Performance Computing
Advanced Near-DUT architecture delivers superior high-speed signal integrity, high parallelism, and a scalable and flexible test foundation for next-generation DRAM and NAND innovations.
Get started
Create a free account to read the full story.